The Cross Section Polisher is a tabletop instrument that uses a broad ion beam to mill a high-quality, artifact-free cross-section of a sample for detailed imaging and microanalysis. This process is ...
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What is Focused Ion Beam Milling? Focused ion beam (FIB) milling is a nanofabrication technique that uses a focused beam of ions to precisely mill, etch, or deposit materials at the nanoscale. It ...
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