A research team led by Prof. Wang Huanqin at the Institute of Intelligent Machines, the Hefei Institutes of Physical Science of the Chinese Academy of Sciences, recently proposed a semi-supervised ...

Classic fault detection and classification has some classic problems. It’s reactive, time-consuming to set up, and any product change involves significant man-hours. Even then, it still misses a lot ...

A new technical paper titled “Semi-Supervised Learning with Wafer-Specific Augmentations for Wafer Defect Classification” was published by researchers at Korea University. “Semi-supervised learning ...