The developed high-speed three-dimensional scanning force microscopy enabled the measurement of 3D force distribution at solid-liquid interfaces at 1.6 s/3D image. With this technique, 3D hydration ...

Researchers have developed a deep learning algorithm for removing systematic effects from atomic force microscopy images, enabling more precise profiles of material surfaces. Atomic force microscopy, ...

The deep learning algorithm developed by researchers at the University of Illinois Urbana-Champaign is trained to remove the effects of the probe’s width from AFM microscope images. As reported in the ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

In this interview, Professor Emeritus Mervyn Miles at the University of Bristol speaks about the history and technology behind Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM). Can ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

A recent international research project has used advanced microscopy techniques and computational modeling to discover why ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...

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